Nikon TU Plan ELWD 100X Brightfield Darkfield Objective STEREO LEICA and materials examination

and materials examination

or accessory equipment during imaging

where a mentor and student must observe the same field in real time

🔭 Compatible with Nikon SMZ series — genuine Nikon accessory for seamless integration

Nikon TU Plan ELWD 100X Brightfield Darkfield Objective STEREO LEICA and materials examinationHigh magnification 100 industrial objective with 4. 5mm working distance for brightfield and darkfield reflected light microscopy of opaque materials. 100 Magnification, 0. 80 NA High resolution imaging with excellent resolving power for detailed surface inspection and analysis. 4. 5mm Extra Long Working Distance Extended clearance protects objective lens and accommodates varied surface topographies. Brightfield & Darkfield Capable Dual mode